Simulation and microscopy data of a Ga enriched Mg Grain Boundary is registered in openBIS and used to create a defect phase diagram.
This IUC Demonstrator is about streamlining the interaction with data on the electronic lab notebook (ELN) and laboratory information management system openBIS. It demonstrates the integration of research data like electron microscope images or atomistic simulation results into the openBIS system. Hereby, the metadata of the files are extracted automatically and stored in the entry on the openBIS system.
For the upload we offer two different routes which are both demonstrated:
In both cases, relevant entries from the openBIS inventory like atomistic simulation potentials, or specific microscopes are linked to the new openBIS entry.
Finally, we demonstrate how such annotated data can be used to create a defect phase diagram based on data from PP02/CRC1394.
NFDI-MatWerk
Funded by the Deutsche Forschungsgemeinschaft (DFG, German Research Foundation) under the National Research Data Infrastructure – NFDI 38/1 – project number 460247524.
NFDI-MatWerk
Funded by the Deutsche Forschungsgemeinschaft (DFG, German Research Foundation) under the National Research Data Infrastructure – NFDI 38/1 – project number 460247524.
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