This Infrastructure Use Case was merged with IUC05 into IUC15.
Motivation
Tomographic data from different techniques (e.g. Atom Probe Tomography, FIB/EBSD serial sectioning) and related simulations need to be stored in the DME in accordance with the underlying ontology for materials tomography and with reference coordinate systems that allow for the fusion of the datasets. A particular challenge here is the large amount of data that needs to be integrated and accessed, testing the performance and scalability of the DME.
All Infrastructure Use Cases
- IUC01 Teaching framework for MSE research data infrastructure
- IUC02 Development and application of a framework for distribution of reference datasets
- IUC03 Storage concepts for large hierarchical datasets - merged into IUC15
- IUC04 Model driven data space exploration
- IUC05 Digital infrastructure and workflows for labs - merged into IUC15
- IUC06 Integrating materials data from experiments and computation (ICME) into Industry 4.0 manufacturing paradigms - transferred to the NFDI Section ‘Industry Engagement’
- IUC07 Beyond 3D: tools for tracking spatiotemporal microstructure evolution
- IUC08 Approaches and best-practise examples for implementing the digital transformation in the daily laboratory work
- IUC09 Infrastructure interfaces with condensed matter physics (collaboration with FAIRmat)
- IUC10 Interoperability of workflow systems
- IUC11 Development of coupled ontologies and workflows for thermochemical treatments
- IUC12 Alignment of application- and higher-level ontologies
- IUC13 Co-creation environment for linked data resources
- IUC14 Integrated data infrastructure for accelerated materials development
- IUC15 Multiscale materials tomography
- IUC16 Unified ontology for matrix-inclusion microstructure and composites – deactivated
- IUC17 Ontologies for defects in crystals
- IUC18 Machine learning for data-driven material modelling and inverse design
- IUC19 Round-robin tests for materials characterization
- IUC20 Standardized description of samples for electron microscopy